Emerson’s Test and Measurement business, formerly known as NI, has unveiled its upcoming premier event, NI Connect, dedicated to showcasing the latest advancements in intelligent NI test and measurement technologies. Scheduled for May 21-22 in Austin, Texas, the event targets test and measurement customers, as well as business and technology leaders.
Ritu Favre, group president of Emerson’s Test and Measurement business, emphasized the event’s focus on demonstrating how NI technologies serve as strategic differentiators in testing. The event will feature keynote speakers from various industries sharing their experiences with NI technologies, illustrating how they drive productivity and innovation.
Among the notable speakers at NI Connect are George Kaehler from Siemens Mobility, who will discuss the productivity gains achieved through NI’s software-centric product ecosystem; Michael O’Sullivan from Analog Devices, who will highlight the benefits of standardizing a unified test platform; Matt Fangman from Microsoft, who will explore the integration of cloud computing and AI in enhancing workflows; and Steve Xie from Lightwheel AI, who will delve into the utilization of generative AI for realistic testing data solutions in autonomous driving.
NI Connect will not only offer livestreamed keynotes but also feature a range of live demonstrations and educational sessions. Attendees will have the opportunity for hands-on experience with current and future products, addressing industry challenges such as software complexity and power consumption.
Technical sessions, led by NI engineering experts and partners, will cover topics including updates in LabVIEW, an introduction to the NI Battery Test Software Suite, and getting started with LabVIEW FPGA.
For those interested in attending the virtual keynotes or registering for NI Connect, registration links are available on the event’s website.
